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Latest research from Semiconductor Science and Technology

from IOP Journal

Experimental and modelling investigation of the influence of noise transit time and self-heating on microwave noise of Si/SiGe:C and InP/InGaAs HBTs

Tunneling currents in a spherically shaped MIS structure

Kink effect and noise performance in isolated-gate InAs/AlSb high electron mobility transistors

Detection of oxygen vacancy defect states in oxide nanobelts by using thermally stimulated current spectroscopy

On the origin of blue emission from ZnO quantum dots synthesized by a sol–gel route more


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